Analysis of Innovation and Competition Processes

Milano (Italy), Palazzo delle Stelline, May 16-18, 2005

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International course

organized by
 

cosponsored by
 

SICC Logo
SICC - Italian Society for Chaos and Complexity

FEEM Logo
FEEM - Fondazione Eni Enrico Mattei

DEI Logo
DEI - Department of Electronics and Information
Politecnico of Milano

IIASA Logo
IIASA - International Institute for Applied Systems Analysis